$X-Ray Diffraction$

X-Ray Diffraction

Name: X-Ray Diffraction
Brand: Unknown
SKU: 9789814303590
Price: 271.0 NZD
Availability: InStock

Modern Experimental Techniques

Summary

X-Ray Diffraction provides a comprehensive overview of high-resolution x-ray diffraction and scattering techniques, essential for analysing structures from the sub-nanometer scale to micrometers in both bulk materials and interfaces. It covers modern synchrotron methods, experimental setups, and recent advancements in detectors, illustrated with current research examples. The book also explores future possibilities with x-ray free electron lasers in diffraction applications.
Read More

Format: Hardback

$271⁰⁰

AVAILABLE WITH SUPPLIER Ships from our Auckland warehouse within 4-6 weeks

Found a better price? Request a price match

$X-Ray Diffraction$

X-Ray Diffraction

$271⁰⁰

Book Hero Magic created this recommendation. While it's new and still learning, it may not be perfect - your feedback is welcome! IS THIS YOUR NEXT READ?

This book is ideal for researchers, engineers, and students in materials science, physics, and engineering keen on advanced structural analysis techniques and the latest developments in x-ray diffraction technology.

Developments in nature and materials sciences are based on the investigation and understanding of nano-scaled properties of matter. This book presents the developments in X-ray diffraction and scattering methods.

Description

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers.

X-Ray Diffraction offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples.

It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.

Book Details

INFORMATION

ISBN: 9789814303590

Publisher: Pan Stanford Publishing Pte Ltd

Format: Hardback

Date Published: 10 February 2015

Country: Singapore

Imprint: Pan Stanford Publishing Pte Ltd

Illustration: 74 Illustrations, color; 74 Illustrations, black and white

Contributors:

Edited by Oliver H. Seeck
Edited by Bridget Murphy

Audience: Tertiary education, Professional and scholarly

DIMENSIONS

Width: 152.0mm

Height: 229.0mm

Weight: 839g

Pages: 444

Collections

Education & Reference Engineering, Technology & Agriculture Non-Fiction Science & Nature

About the Author

Oliver H. Seeck is a scientist at HASYLAB-DESY in Hamburg, Germany. Bridget Murphy is a scientist based at the University of Kiel in Germany.