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Statistical Intervals

A Guide for Practitioners and Researchers
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Statistical Intervals offers a comprehensive guide to quantifying sampling uncertainty through statistical intervals, focusing on practical applications and recently developed methodologies. This second edition significantly expands on the original 1991 work, incorporating new techniques enabled by advances in computing power. Key topics include likelihood-based intervals, bootstrap methods, Bayesian intervals, and their applications in common distributions and hierarchical models. The book also features advanced case studies, technical appendices, and links to current software resources.
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Format: Hardback
$22499
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This detailed guide is ideal for practitioners and researchers in engineering, technology, and statistics who require robust methods for analysing data uncertainty through statistical intervals.

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Statistical Intervals is a guide for practitioners and researchers--providing a detailed, comprehensive, modernized treatment of this important subject. With numerous examples, it presents and differentiates in an easy-to-apply manner the use of confidence intervals (e.g.

Book Hero Magic formatted this description to make it easier to read. While it's new and still learning, it may not be perfect - your feedback is welcome! Description

Describes statistical intervals to quantify sampling uncertainty, focusing on key application needs and recently developed methodology in an easy-to-apply format.

Statistical intervals provide invaluable tools for quantifying sampling uncertainty. The widely hailed first edition, published in 1991, described the use and construction of the most important statistical intervals. Particular emphasis was given to intervalsโ€”such as prediction intervals, tolerance intervals, and confidence intervals on distribution quantilesโ€”frequently needed in practice but often neglected in introductory courses.

Vastly improved computer capabilities over the past 25 years have resulted in an explosion of the tools readily available to analysts. This second editionโ€”more than double the size of the firstโ€”adds these new methods in an easy-to-apply format. In addition to extensive updating of the original chapters, the second edition includes new chapters on:

  • Likelihood-based statistical intervals
  • Nonparametric bootstrap intervals
  • Parametric bootstrap and other simulation-based intervals
  • An introduction to Bayesian intervals
  • Bayesian intervals for the popular binomial, Poisson, and normal distributions
  • Statistical intervals for Bayesian hierarchical models
  • Advanced case studies, further illustrating the use of the newly described methods

New technical appendices provide justification of the methods and pathways to extensions and further applications. A webpage directs readers to current readily accessible computer software and other useful information.

Statistical Intervals: A Guide for Practitioners and Researchers, Second Edition is an up-to-date working guide and reference for all who analyse data, allowing them to quantify the uncertainty in their results using statistical intervals.

Series: Wiley Series in Probability and Statistics

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Book Details

INFORMATION

ISBN: 9780471687177

Publisher: John Wiley & Sons Inc

Format: Hardback

Date Published: 06 June 2017

Country: United States

Imprint: John Wiley & Sons Inc

Edition: 2nd edition

Illustration: Tables: 75 B&W, 0 Color; Graphs: 75 B&W, 0 Color

Audience: Professional and scholarly

DIMENSIONS

Spine width: 38.0mm

Width: 183.0mm

Height: 252.0mm

Weight: 1270g

Pages: 648

About the Author

William Q. Meeker is Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University.ย He is the co-author of Statistical Methods for Reliability Data, 2nd Edition (Wiley, 2021)ย and of numerous publications in the engineering and statistical literature and has won many awards for his research.

Gerald J. Hahn served for 46 years as applied statistician and manager of an 18-person statistics group supporting General Electric and has co-authored four books. His accomplishments have been recognized by GE's prestigious Coolidge Fellowship and 19 professional society awards.

Luis A. Escobar is Professor of Statistics at Louisiana State University. He is the co-author of Statistical Methods for Reliability Data, 2nd Edition (Wiley, 2021)ย and several book chapters. His publications have appeared in the engineering and statistical literature and he has won several research and teaching awards.

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